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Four Probe Method

Four Probe Method
Four Probe Method
Product Code : KST/ELC/1254
Brand Name : KAPUR
Product Description

We are satisfying the variegated demands of our esteemed customers by offering a wide range of Four Probe Method. This product is highly praised by the clients due to their optimum performance. This range of product is largely used for accurately measuring the resistivity of any semiconductor. Offered product is manufactured under the proper direction of our skilled personnel by using the high quality material and sophisticated technology in compliance with the preset industry guidelines. Clients can get this Four Probe Method from us at industry leading prices.

Features:

  • Optimum functionality
  • Corrosion resistant
  • Durable finish standards


Further Details:

Four Probe Method

Specifications

1.Probes Arrangement
It has four individually spring loaded probes. The probes are collinear and equally spaced.

The Four Probe Method is one of the standard and most widely used method for the measurement of resistivity of semiconductors. The experimental arrangement is illustrated. In its useful form, the four probes are collinear. The error due to contact resistance, which is specially serious in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistances are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter),the measured value will remain unaffected. Because of pressure contacts, the arrangement is also specially useful for quick measurement on different samples or sampling different parts of the same sample.

Description of the experimental setup

1. Probes Arrangement
It has four individually spring loaded probes. The probes are collinear and equally spaced. The probes are mounted in a PTFE bush, which ensure a good electrical insulation between the probes. A PTFE spacer near the tips is also provided to keep the probes at equal distance. The whole –arrangement is mounted on a suitable stand and leads are provided for the voltage measurement.

2. Sample
Germanium crystal in the form of a chip

3. Oven
It is a small oven for the variation of temperature of the crystal from the room temperature to about 200°C (max.)